
Certified Tester Advanced Level Test Analyst
Domain 5Objective 4
Analyzing Test Results to Improve Defect Detection CTAL-TA Practice Questions (Page 2)
Part of the Software Defect Prevention domain, which makes up ~29% of our current practice bank. ISTQB does not publish an official question count, but from its 120-minute exam (~50–80 total, ~15–23 in this domain), expect 3–5 from this objective — we provide 13 practice questions to prepare you well beyond it. (estimate)
13questions here
3free pages
2concepts
Questions 6–10
- 6
After a major release, a test analyst reviews the defect reports and notices that many defects were found in the area of user authentication, but the test cases for authentication had high pass rates. What should the test analyst do to improve defect detection in future releases?
Select an answer first - 7
A test analyst notices that a high percentage of defects found in the last two releases were detected during system testing, but very few were found during component testing. The defects are spread across multiple modules, with no single module showing a higher concentration. What should the test analyst do first to improve defect detection?
Select an answer first - 8
Based on analysis of previous test cycles, a test analyst finds that most defects were missed because test data did not include special characters. What is the most effective way to improve future defect detection?
Select an answer first - 9
A test analyst is analyzing the results of a test cycle and finds that the defect detection rate is high, but the defect removal efficiency (DRE) is low. What does this indicate?
Select an answer first - 10
A test analyst notices that defects in a legacy module are often found late in the test cycle. What is a suitable improvement to apply for future test cycles?
Select an answer first
Finished these 5 questions?
Review the revealed explanations, or continue through the curriculum.
Free Basic Practice is a study aid with revealable answers — not a scored exam. Examers.io is independent and not affiliated with or endorsed by ISTQB. “CTAL-TA” is a trademark of its owner, used for identification only.